Recently, Based on the National Instruments (Ni ") PXI source measurement unit (SMU), focusing on the use of artificial intelligent drive semiconductor test measurements, Beijing Boda Micro Technology Co., Ltd. announced Introducing the latest machine-learning-based semiconductor parametric test products FS-PRO, truly integrate usually low-frequency characteristic measurements such as IV test, CV test, low frequency noise (1 / F noise) test, and achieve all tests in a single instrument Demand and increase the test speed by 10 times, and shorten the test time required for dozens of seconds in the low frequency noise test to 5 seconds.
Nowadays, since IOT development is rapid, the size of the chip is growing, and Moore's law has gradually been applicable. As newly released "Ni Trend Watch 2018" introduces, although the applicability of Moore's law is again threatened, it is threatened again, but the machine learning, The market demand headed by automatic driving will continue to extend processing capabilities and I / O bandwidth, providing new opportunities for promoting architecture innovation. Therefore, in order to break the limitations inherent in the traditional instrument, more future intelligent test programs have become a priority of the semiconductor test industry, and Ni is through its own modular hardware flexibility, continuous supporting industry advanced. CHANDRAN NAIR, vice president of Asia Pacific, said: "We are impressive in the intelligent parameters test plan developed by Bodia Micro Technology using Ni latest SMU, and achieve excellent accuracy and testing through Bad Micro Technology and Ni hardware. Speed believes that it is very suitable for parameter research and mass production test. "
Ni SMU, integrated high-precision + high speed + high channel, helping AI algorithm enterprises become new forces for semiconductor testing
In fact, this is not the first cooperation of Ni and Bodiam. In 2017, the Bada will release a machine-learning-based first-generation semiconductor parameterized test product FS series, based on Ni modular hardware, in testing accuracy and The sensitivity has been upgraded. Boda Michel, Li Yanfeng in Nidays 2017, "From a more than one year ago and test 'insulation' software and algorithm company, to the current output of the market with a very good parametric test equipment, many of them The flexibility of the NI modular hardware platform is convenient for us to quickly deploy algorithms, quickly deploy expert experience to the test system. "Buda Micro in the semiconductor parameter test Ni hardware platform is its SMU.
High-precision measurements are performed with high-precision measurements in high-test current sensitivity, and the low noise measurement performance of high test speed, and the number of consequently broken channels is the reason for Ni SMU in automated testing and laboratory characteristic analysis. . In addition, Ni SMU compact constituent structure and modular characteristics make it a parallel IV test system important instrument, and modular PXI platforms can help customers trigger SMUs through the PXI backplane to synchronize with other instruments, including high-speed digital I / O Instruments, RF analyzers, generators, high-speed digitors.
Figure 1. Ni launches new 24-channel high-density, high precision SMU - PXIE-4163
Based on Ni modular hardware, the AI application is fully, accelerated semiconductor parameter test is one
Using the machine replaces AI to achieve cognition, analysis, and decision-making, the machine is being accelerated by calculation, algorithm, data quantity and application scenario, and the winner of the AI industry will be those who can quickly solve the physical economic problem. Improve industry efficiency, even companies that subvert the traditional business model.
Based on the flexible Ni modular hardware, the Boda Micro Algorithm Team will use the "behavior forecast", "behavioral forecast", "noise removal", "noise removal", and "noise removal", and "noise removal", "noise removal", "noise removal", "noise removal" To the semiconductor test, the measurement breaks through the original physical boundary, and its parametric instrument has quickly obtained market recognition. The business value of using artificial intelligence (AI) drive test is faster, it is reported that Boda can have reached up to 10 times efficiency; more stable, through behavioral prediction, reduce misoperation and unwanted signals; more intelligence, pass through The intelligent deployment of machine learning allows test instruments to have a more measurement of performance. "FS-Pro is the first time the industry integrates IV, CV, and noise test into a single device. It does not need to change the customer to complete almost all low frequency parametric characterization, and increase the test speed 10 times. At the same time, the module provided based on Ni Architecture, users can expand flexibly, from four channels to nearly 100 channels, "Li Yanfeng emphasized.
Figure 2. High-precision semiconductor parameter integrated test system driven by the industry's first learning algorithm based on Ni SMU
SMUs that continue to launch higher channels, while continuously helping customers reduce test costs and time while taking into account semiconductor testing performance, it can be seen that Ni can be seen in the long-term investment in the semiconductor test field. Chandran Nair emphasizes: "NI will continue to support Badmia in technology and market, continuously provide faster, more stable, and smarter parametric test programs for customers in semiconductor sectors."
Original address: https://www.eeboard.com/news/ni-smu/
Search for the panel network, pay attention, daily update development board, intelligent hardware, open source hardware, activity and other information can make you master. Recommended attention!
[WeChat scanning picture can be directly paid]
Our other product:
